发明名称 |
SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To take a countermeasure against power supply noise efficiently by forming a capacitor at a desired position with no restriction of interconnection and to fabricate a capacitor of large capacity with a smaller area even in a finer pattern process technology. SOLUTION: An extra capacitor or a capacitor is fabricated utilizing the capacitance between interconnections (between M11 and M12) or the capacitance between through holes (between B11 and B12) which is increased as a finer patterning is employed in the process technology. For example, an extra capacitance can be formed easily in the vicinity of a part where switching noise is generated and a countermeasure can be taken efficiently against power supply noise. Furthermore, a capacitor of large capacity can be fabricated with a smaller area even in a finer pattern process technology using the same process as other devices without requiring any special process additionally.
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申请公布号 |
JP2001085630(A) |
申请公布日期 |
2001.03.30 |
申请号 |
JP20000212973 |
申请日期 |
2000.07.13 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
TAMARU MASAKI;MORIWAKI TOSHIYUKI;SUZUKI RYOICHI |
分类号 |
H01L23/52;H01L21/3205;H01L21/822;H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L23/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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