发明名称 SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To take a countermeasure against power supply noise efficiently by forming a capacitor at a desired position with no restriction of interconnection and to fabricate a capacitor of large capacity with a smaller area even in a finer pattern process technology. SOLUTION: An extra capacitor or a capacitor is fabricated utilizing the capacitance between interconnections (between M11 and M12) or the capacitance between through holes (between B11 and B12) which is increased as a finer patterning is employed in the process technology. For example, an extra capacitance can be formed easily in the vicinity of a part where switching noise is generated and a countermeasure can be taken efficiently against power supply noise. Furthermore, a capacitor of large capacity can be fabricated with a smaller area even in a finer pattern process technology using the same process as other devices without requiring any special process additionally.
申请公布号 JP2001085630(A) 申请公布日期 2001.03.30
申请号 JP20000212973 申请日期 2000.07.13
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TAMARU MASAKI;MORIWAKI TOSHIYUKI;SUZUKI RYOICHI
分类号 H01L23/52;H01L21/3205;H01L21/822;H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L23/52
代理机构 代理人
主权项
地址