TEST SOCKET, CHANGE KIT AND TESTER

摘要

PROBLEM TO BE SOLVED: To replace a type of a semiconductor chip in a short time and to immediately test the chip in a mass production mode in a tester for the chip of a flip-chip type. SOLUTION: In the tester of a semiconductor chip, when a test socket of the test socket and a change kit required for a most regulating time in replacing of a type of the chip to be tested is exemplified, the socket has a terminal plate 22 having a terminal group 28 disposed in a matrix at the same pitch as that of ball bumps 32 of the chip 30 and made of terminals 34 of sufficient number capable of being electrically connected to the bumps 32, and inner walls 40 for specifying sides for forming parallel to four sides of a rectangle formed of the group 28 disposed in the matrix. Thus, the socket 20 has a mounting guide 24 made of a guide member 41 detachably arranged on the plate 22.