| 摘要 |
PROBLEM TO BE SOLVED: To obtain a semiconductor integrated circuit facilitating installation of a terminal at a periphery of a chip and needing no external controller for controlling generation of a selection address signal by limiting number of terminals for measuring characteristics to measure the characteristics of a plurality of elements to be measured. SOLUTION: The semiconductor integrated circuit having a plurality of elements 11 to be measured and a terminal 13 for measuring characteristics comprises a counter 14 for outputting a selection address signal a for selectively connecting the plurality of the elements 11 to the terminal 13. In this case, the counter 14 is driven by a signal scanned when measured at the characteristics to automatically generate thee signal a.
|
