发明名称 SEMICONDUCTOR DEVCIE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which has satisfactory electrical characteristics and which is small-size and has superior heat resisting property. SOLUTION: A semiconductor element 12 with its front and rear faces formed with electrodes is heated preliminarily to gain a specified level of ohmic contact property for the rear face electrode of the element 12. An insulating substrate is prepared which is formed on its front side with a plurality of regularly formed same circuit patterns, and on its rear side with a plurality of regularly formed external electrodes 15 connected to the circuit patterns on the front side via through-holes 14 or via holes. The rear face electrode of the semiconductor element 12 is bonded on an element-mounting section 13a of the circuit patterns formed on the front face of the insulating substrate with a conductive adhesive which is hardened at a low temperature. An inner electrode 13b of the circuit patterns of the insulating substrate is connected to the front face electrode of the semiconductor element with a metal fine wire 16. Then, the entire surface of the insulating substrate formed with the circuit patterns is sealed with resin, and the structure is divided into individual semiconductor devices.
申请公布号 JP2001085450(A) 申请公布日期 2001.03.30
申请号 JP19990256256 申请日期 1999.09.09
申请人 TOSHIBA CORP 发明人 ARAKI KOJI;SAKURAI MASAHIKO;MATSUZAKI TAKASHI;TAKAYAMA SHINICHI;WADA ISAMU;KAMEBUCHI TAKESHI;YAMAMOTO MANABU
分类号 H01L23/12;H01L21/301;H01L21/52;H01L21/56;H01L29/41;H01L29/417 主分类号 H01L23/12
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