发明名称 |
SEMICONDUCTOR DEVCIE AND MANUFACTURING METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which has satisfactory electrical characteristics and which is small-size and has superior heat resisting property. SOLUTION: A semiconductor element 12 with its front and rear faces formed with electrodes is heated preliminarily to gain a specified level of ohmic contact property for the rear face electrode of the element 12. An insulating substrate is prepared which is formed on its front side with a plurality of regularly formed same circuit patterns, and on its rear side with a plurality of regularly formed external electrodes 15 connected to the circuit patterns on the front side via through-holes 14 or via holes. The rear face electrode of the semiconductor element 12 is bonded on an element-mounting section 13a of the circuit patterns formed on the front face of the insulating substrate with a conductive adhesive which is hardened at a low temperature. An inner electrode 13b of the circuit patterns of the insulating substrate is connected to the front face electrode of the semiconductor element with a metal fine wire 16. Then, the entire surface of the insulating substrate formed with the circuit patterns is sealed with resin, and the structure is divided into individual semiconductor devices. |
申请公布号 |
JP2001085450(A) |
申请公布日期 |
2001.03.30 |
申请号 |
JP19990256256 |
申请日期 |
1999.09.09 |
申请人 |
TOSHIBA CORP |
发明人 |
ARAKI KOJI;SAKURAI MASAHIKO;MATSUZAKI TAKASHI;TAKAYAMA SHINICHI;WADA ISAMU;KAMEBUCHI TAKESHI;YAMAMOTO MANABU |
分类号 |
H01L23/12;H01L21/301;H01L21/52;H01L21/56;H01L29/41;H01L29/417 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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