发明名称 METHOD AND SYSTEM OF LCD INSPECTION BY PATTERN COMPARISON
摘要 This patent discloses the method and system design of an automated visual inspection system for liquid crystal displays (LCDs). Image defect is detected by comparing the image displayed by an LCD panel under inspection with a template image which the LCD panel is supposed to display. The LCD panel under inspection is allowed to be placed loosely on the inspection platform. The algorithm corrects for the effect of object pose and image perspective to produce a 2-D image of the pattern that appears on the LCD panel. Next, the two patterns are subtracted to obtain an error image. From the error image, pattern discrepancy is evaluated at every pixel location to detect for LCD defects.
申请公布号 WO0122070(A1) 申请公布日期 2001.03.29
申请号 WO1999JP05118 申请日期 1999.09.20
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.;YABE, TATSUYA;KAIDA, MAKOTO;LAU, KEAN, HONG;TONG, KOK, HUA 发明人 YABE, TATSUYA;KAIDA, MAKOTO;LAU, KEAN, HONG;TONG, KOK, HUA
分类号 G01B11/30;G01M11/00;G01N21/95;G01N21/956;G02F1/13;G06T1/00;G06T7/00 主分类号 G01B11/30
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