发明名称 BACKSIDE CHEMICAL ETCHING AND POLISHING
摘要 A process for backside chemical etching and polishing of substrates including the steps of protecting the front surface of the wafer, chemical etching, first dump rinse/spin dry, backside polishing, residue cleaning, second dump rinse/spin dry, and front surface protection removal. The process is generally intended to be used for semiconductor wafers, but it can also be used for processing other types of substrates such as GaAs, GaP, GaAIAs, GaAIP, ceramics, quartz, bonded silicon wafers, dielectric isolated wafers and substrates, etc.
申请公布号 WO0122476(A2) 申请公布日期 2001.03.29
申请号 WO1999US17169 申请日期 1999.07.28
申请人 HAQ, NOOR 发明人
分类号 H01L21/302 主分类号 H01L21/302
代理机构 代理人
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