| 摘要 |
<p>Disclosed is a method for characterizing a sample (315) having a structure (310) disposed on or within the sample (315), comprising the steps of applying a first pulse of light to a surface (312) of the sample for creating a propagating strain pulse (316, 314) in the sample (315), applying a second pulse of light to the surface (312) so that the second pulse of light interacts with the propagating strain pulse (316, 314) in the sample (315), sensing from a reflection of the second pulse a change in optical response of the sample (315), and relating a time of occurence of the change in optical response to at least one dimension of the structure (310).</p> |
