发明名称 Wafer polishing apparatus
摘要 A wafer polishing apparatus according to this invention has a polishing unit that includes three platens and two polishing heads. Injection ports are disposed between the platens. The two polishing heads can linearly move between the platens. In a two-step polishing process, while the polishing head holds a wafer after polishing by a platen, the wafer is transferred to a center platen which provides different polishing characteristics. In this instance, washing water from the injection ports washes away slurry, etc, adhering to the wafer. The wafer is then carried to the center platen beyond a waiting unit and is subjected to further polishing.
申请公布号 GB0103539(D0) 申请公布日期 2001.03.28
申请号 GB20010003539 申请日期 2001.02.13
申请人 TOKYO SEIMITSU CO., LTD. 发明人
分类号 B24B37/04;B24B55/02;H01L21/00;H01L21/304 主分类号 B24B37/04
代理机构 代理人
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