发明名称 |
System to quantify gamma-ray radial energy deposition in semiconductor detectors |
摘要 |
A system for measuring gamma-ray radial energy deposition is provided for use in conjunction with a semiconductor detector. The detector comprises two electrodes and a detector material, and defines a plurality of zones within the detecting material in parallel with the two electrodes. The detector produces a charge signal E(t) when a gamma-ray interacts with the detector. Digitizing means are provided for converting the charge signal E(t) into a digitized signal. A computational means receives the digitized signal and calculates in which of the plurality of zones the gamma-ray deposited energy when interacting with the detector. The computational means produces an output indicating the amount of energy deposited by the gamma-ray in each of the plurality of zones.
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申请公布号 |
US6207957(B1) |
申请公布日期 |
2001.03.27 |
申请号 |
US19980156987 |
申请日期 |
1998.09.18 |
申请人 |
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA |
发明人 |
KAMMERAAD JUDITH E.;BLAIR JEROME J. |
分类号 |
G01T1/24;G01T1/29;(IPC1-7):G01T1/24 |
主分类号 |
G01T1/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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