发明名称 MACHINING DEVICE FOR FLATTENING SAMPLE
摘要 PROBLEM TO BE SOLVED: To prevent the erroneous detection of sample separation by providing a sample separation determining means applying wavelet conversion to data and judging and determining the sample separation with a wavelet spectrum when a sample is separated from a holder. SOLUTION: The sample separation determining means 15 applies discrete wavelet conversion to the output wave-form of a sample separation sensor 11, extracts the feature of sample separation from a wavelet spectrum of the prescribed order (frequency component), and clearly distinguishes and determines a sample separation state from a noise component. When the determining means 15 determines the sample separation unaffected by the noise component, it outputs an action instruction to cope with the situation to a control means 16 of a turntable 1 or/and a holder 3. The control means 16 controls a holder lift mechanism 9 to lift the holder 3 from the turntable 1 together with a sample 4, thus preventing the breakage of the sample 4 and the turntable 1 or the like when the sample 4 is separated.
申请公布号 JP2001079760(A) 申请公布日期 2001.03.27
申请号 JP19990257505 申请日期 1999.09.10
申请人 HITACHI LTD;HITACHI SCI SYST LTD 发明人 MORITA KAZUHIRO;KUGAYA TAKASHI
分类号 B24B49/12;(IPC1-7):B24B49/12 主分类号 B24B49/12
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