发明名称 METHOD FOR FORMING TRENCH ISOLATION
摘要 PURPOSE: A trench isolation formation method is provided to prevent a damage of silicon lattices, such as a dislocation and a stress of a silicon substrate by forming a thermal oxide layer on a trench and by rounding edge portions of the trench. CONSTITUTION: A semiconductor substrate(10) is vertically etched by using a trench formation pattern as a mask to form an opening, and the substrate of the lower portion of the opening is etched to form a trench, thereby rounding the edge portions of the trench. A thermal oxide layer(16) is formed at both sidewalls and the bottom of the trench so as to remove a damage and a stress of the substrate(10). An oxidation barrier layer made of SiON is formed on the thermal oxide layer(16). An insulating substance is filled into the trench and annealed in order to densify the insulating substance.
申请公布号 KR100292614(B1) 申请公布日期 2001.03.26
申请号 KR19980014912 申请日期 1998.04.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAE, DAE HUN;HONG, GYEONG HUN;KOO, BON YEONG;NAM, SEOK U
分类号 H01L21/76;H01L21/316;(IPC1-7):H01L21/76 主分类号 H01L21/76
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