METHOD OF EXTRACTING TIMING CHARACTERISTICS OF TRANSISTOR CIRCUITS, STORAGE MEDIUM STORING TIMING CHARACTERISTIC LIBRARY, LSI DESIGNING METHOD, AND GATE EXTRACTION METHOD,申请号KR1020007001718-传众专利搜索

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发明名称	METHOD OF EXTRACTING TIMING CHARACTERISTICS OF TRANSISTOR CIRCUITS, STORAGE MEDIUM STORING TIMING CHARACTERISTIC LIBRARY, LSI DESIGNING METHOD, AND GATE EXTRACTION METHOD
摘要
申请公布号	KR20010023096(A)	申请公布日期	2001.03.26
申请号	KR1020007001718	申请日期	2000.02.19
申请人		发明人
分类号	G06F17/50	主分类号	G06F17/50
代理机构		代理人
主权项
地址

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