发明名称 HEAT TREATMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To shorten the heating/cooling processing time of a planar body to be treated, to uniformize the in-plane temperature distribution of the body under treatment and improve the manufacture yield. SOLUTION: A heat treatment part 100 having a heating unit 21A heating a semiconductor wafer W to a prescribed temperature and a cooling unit 11A for cooling it to the prescribed temperature, a resist processing part having at least either one of a resist applying device 12 applying resist solution to the semiconductor wafer W and a developing device 8 executing a developing processing thereon, a main arm 5 for transferring the semiconductor wafer W between the heat treatment part 100 and the resist processing part, and a sub-arm 90 for transferring the semiconductor wafer W between the prescribed units in the heat treatment part. A cooling temperature adjusting body 40 for cooling the semiconductor wafer W to a prescribed temperature is installed in the sub-arm 90.
申请公布号 JP2001077020(A) 申请公布日期 2001.03.23
申请号 JP20000218486 申请日期 2000.07.19
申请人 TOKYO ELECTRON LTD 发明人 AKUMOTO MASAMI;SAKAMOTO YASUHIRO;HARADA KOJI
分类号 G03F7/16;B65G49/07;G03F7/38;G03F7/40;H01L21/027;H01L21/677;H01L21/68 主分类号 G03F7/16
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