| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection apparatus in which the operating efficiency of a maintenance operation can be enhanced by a method wherein a plurality of probe pins composed of a conductive material are held so as to be freely detachable in a prescribed positional relationship according to a wiring pattern of a circuit board and the state of the circuit board is inspected. SOLUTION: In this apparatus 1, ends, on one side, of respective receptacles 20 are fixed to, and held by, a pin base 7 which is laminated and formed on a lower-side fixture 5A in such a way that they correspond to terminal groups of respective connectors 4C formed on one face 4A of a motherboard. In addition, a plurality of probe pins 8 are attached to ends, on the other side, of the respective receptacles 20 in such a way that probe formation parts 25 held by an elastic force are freely detachable. Thereby, even when any probe pin 8 whose tip is degraded or damaged is generates out of the plurality of probe pins 8 coming into contact with the terminal groups of the respective connectors 4C, only the probe formation part 25 holding the probe pin 8 is removed from the corresponding resptacles 20, and probe formation parts 25 which hold the probes 8 are newly attached separately.
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