发明名称 PARTICLE ANALYSIS DEVICE
摘要 PROBLEM TO BE SOLVED: To efficiently determine particle information by detecting light being emitted from each particle at the first flow region of a sample liquid flow, picking up the particle image of each particle at a second flow region, obtaining a first feature parameter from the detected light, and obtaining a second feature parameter from the particle image that has been picked up. SOLUTION: Beams L1 and L2 from a continuous emission laser light source 1 and a pulse light source 2 are applied to a square-shaped sheath flow cell 3 so that they orthogonally cross each other. Sample liquid containing a particle is guided to the sheath flow cell 3, thus forming a liquid flow that is narrowed thinly. A continuous emission laser beam is applied to a sample liquid flow via a condenser lens 4, is collected by a condensation lens 5, and is received by a photodiode 7. An image pickup control circuit supplies an emission trigger signal to a pulse light source 2, and a data-processing device calculates a second feature parameter from the projection image of each particle and creates a two-dimensional scattergram according to the first and second feature parameters for displaying on a display.
申请公布号 JP2001074643(A) 申请公布日期 2001.03.23
申请号 JP19990245701 申请日期 1999.08.31
申请人 SYSMEX CORP 发明人 KOBAYASHI HIRONORI;KUSUZAWA HIDEO;IMURA YASUYUKI
分类号 G01N15/14;G01N15/02;(IPC1-7):G01N15/14 主分类号 G01N15/14
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