| 摘要 |
PROBLEM TO BE SOLVED: To enable to retrieve failure factors by automatically changing test conditions at a high speed, regarding a device test estimating system and its method which retrieve failure factors of a device to be measured like an LSI (large scale integrated circuit) and perform test estimation. SOLUTION: This device test estimating system 1 is provided with a terminal sort classifying means 2 for classifying devices in a plurality of terminal sorts on the basis of test condition setting information relating to various kinds or test conditions of device to be measured, a means 3 for obtaining test condition data of each terminal sort which obtains data of margin of test conditions by changing test conditions for each of the plurality of terminal sorts, and a means 4 for retrieving failure factors of each terminal sort which retrieves failure factors of a specified terminal sort corresponding to the data of margin of test conditions and detects a defective terminal from the specified terminal soft.
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