发明名称 SEMICONDUCTOR MANUFACTURING DEVICE, ITS CLEANING METHOD AND LIGHT SOURCE UNIT
摘要 PROBLEM TO BE SOLVED: To shorten the downtime attendant on the removal of a sublimable compound, to simplify removal work and improve safety in a semiconductor manufacturing devise for applying an organic film of an anti-reflection film to the surface of a semiconductor wafer. SOLUTION: The top plate 34 of a hot plate 30 heating a semiconductor wafer 38 is formed of a light transmission material such as quartz. A light source unit 36 generating an ultraviolet ray which effectively dissolves organic compound is arranged above the top plate 34. In a hot plate unit 28, the semiconductor wafer 38 to which an organic material has been applied is baked. A sublimable compound contained in the organic material sticks to the lower face of the top plate 34 consequent upon a baking treatment. Whenever the hot plate unit 28 processes the prescribed number of semiconductor wafers 38, the light source unit 36 is allowed to emit light and compound adhered to the top plate 34 is irradiated with the ultraviolet ray.
申请公布号 JP2001077011(A) 申请公布日期 2001.03.23
申请号 JP19990254571 申请日期 1999.09.08
申请人 MITSUBISHI ELECTRIC CORP;RYODEN SEMICONDUCTOR SYST ENG CORP 发明人 ONO RYOJI;HATTORI SACHIKO;ODAMURA YUKO
分类号 H01L21/027;F27B5/14;F27B17/00;F27D99/00;G03F7/11;G03F7/16;H01L21/00;H01L21/304 主分类号 H01L21/027
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