发明名称 FOREIGN MATTER INSPECTING APPARATUS
摘要 PROBLEM TO BE SOLVED: To obtain a foreign matter inspecting apparatus discriminating between the image pattern of an air bubble containing foreign matter and that of an air bubble containing no foreign matter by fixed independent inspection to recognize only the air bubble containing foreign matter as a flaw. SOLUTION: A foreign matter inspecting apparatus applying image processing to the surface of a transparent film or sheet 10 to detect the inferior foreign matter 15 of the transparent film or sheet 10 has a foreign matter recognizing means discriminating between a detection pattern based on an air bubble with foreign matter generated around foreign matter 1 being a nucleus and a detection pattern based on an air bubble not containing foreign matter as a nucleus on the basis of the difference between the detection patterns subjected to image processing and recognizing only detection pattern based on the air bubble with foreign matter as an inferior detection pattern.
申请公布号 JP2001074666(A) 申请公布日期 2001.03.23
申请号 JP19990245321 申请日期 1999.08.31
申请人 SEKISUI CHEM CO LTD 发明人 SHIGENOBU YASUSHI
分类号 G01N21/892;(IPC1-7):G01N21/892 主分类号 G01N21/892
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