发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which displays an excellent negative differential conductance or a negative mutual conductance and can be manufactured through a rather simple manufacturing process. SOLUTION: A semiconductor device is equipped with a channel layer 13 which functions as a conduction region and a floating region 18 electrically isolated from the channel layer 13. A quantum well layer composed of a pair of barrier layers 15 and 17 and a well layer 16 pinched between the barrier layers 15 and 17 is provided between the channel layer 13 and the floating region 18. A source electrode 22 and a drain electrode 23 are electrically connected to the channel layer 13. A gate electrode 21 is provided above the floating region 18, but the well layer 16 is located below the region 18. When a drain voltage is varied to a prescribed gate voltage, a negative differential conductance occurs in drain current characteristics of a semiconductor device.
申请公布号 JP2001077352(A) 申请公布日期 2001.03.23
申请号 JP19990253531 申请日期 1999.09.07
申请人 SONY CORP 发明人 SUZUKI JUICHI;ONO HIDEKI
分类号 H01L29/812;H01L21/338;H01L29/10;H01L29/772;H01L29/778;H01L29/80;(IPC1-7):H01L29/778 主分类号 H01L29/812
代理机构 代理人
主权项
地址