| 摘要 |
PROBLEM TO BE SOLVED: To enhance the effect of a test by a method wherein every power- supply line which supplies a power supply to the prescribed terminal of an IC socket is provided, a GND line which grounds a terminal is provided and a plurality of signal line groups whose lengths are different according to every IC socket are provided. SOLUTION: An IC tester body 2, a test head 3 which is connected to the body 2 and a test board 5 which is connected to the test head 3 by a POGO pin 4 constitute this IC tester 1. By this constitution, (n) pieces of ICs which are to be tested are inserted respectively into corresponding sockets SO1 to SOn. When the same test is performed simultaneously in all the sockets SO1 to SOn, a through current flows to the respective ICs which are inserted into the respective sockets SO1 to SOn when a signal which is input to the respective sockets SO1 to SOn from the test board 5 is changed over. A peak current flows to the test board 5. Since the length of respective signal lines in signal line groups A1 to An id different in this constitution, the peak value of a current flowing to the test board 5 is lowered as compared with a case in which the timing of the peak is identical.
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