发明名称 |
THIN FILM TRANSISTOR, LIQUID CRYSTAL DISPLAY DEVICE, AND MANUFACTURE OF THIN FILM TRANSISTOR |
摘要 |
<p>PROBLEM TO BE SOLVED: To improve productivity in the deposition of the a-Si film of a thin film transistor and also enhance the thin film transistor in characteristics. SOLUTION: An amorphous silicon film 2, a gate insulating film 3, a gate insulating film 3, and a gate electrode 4 are sequentially laminated on an insulating substrate 1 for the formation of a thin film transistor. In this case, the amorphous silicon film 2 is composed of a low-defect density amorphous silicon layer 5 that is formed at a low deposition rate and a high-speed amorphous silicon layer 6 formed at a higher deposition rate than the silicon layer 5, where the amorphous silicon layer 5 is located closer to the insulating board 1 than the amorphous silicon layer 6, and the amorphous silicon layer 6 is formed coming into contact with the under surface of the gate insulating film 3.</p> |
申请公布号 |
JP2001077366(A) |
申请公布日期 |
2001.03.23 |
申请号 |
JP19990233920 |
申请日期 |
1999.08.20 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
TSUJIMURA TAKATOSHI;TOKUHIRO OSAMU;MIYAMOTO TAKASHI;MOROOKA MITSUO |
分类号 |
H01L21/205;G02F1/136;G02F1/1368;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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