发明名称
摘要 <p>The invention comprises a combination of a low resistivity, or electrically conducting, silicon layer that is transparent to long or short wavelength photons and is attached to the backside of a photon-sensitive layer of silicon, such as a silicon wafer (6) or chip. The window is applied to photon sensitive silicon devices such as photodiodes, charge-coupled devices, active pixel sensors, low-energy x-ray sensors and other radiation detectors. The silicon window is applied to the back side (10) of a photosensitive silicon wafer or chip so that photons can illuminate the device from the backside without interference from the circuit printed on the frontside. A voltage sufficient to fully deplete the high-resistivity photosensitive silicon volume of charge carriers is applied between the low-resistivity back window and the front, patterned, side of the device.</p>
申请公布号 JP2001503918(A) 申请公布日期 2001.03.21
申请号 JP19980521753 申请日期 1997.10.31
申请人 发明人
分类号 H01L27/14;H01L27/146;H01L27/148;H01L31/0216;H01L31/0224;H01L31/10;(IPC1-7):H01L27/14 主分类号 H01L27/14
代理机构 代理人
主权项
地址