发明名称 |
METHOD FOR INSPECTING PATTERN WIDTH OF STENT SURFACE |
摘要 |
<p>PROBLEM TO BE SOLVED: To efficiently inspect the finishing state of the pattern width on a stent surface. SOLUTION: This method for inspecting the pattern width on the surface of the cylindrical stent 1 manufactured by laser beam processing consists in rotatably supporting the stent 1 in a horizontal state, disposing a CCD camera 2 connected to a computer 5 via an image processor 4 orthogonally with the axis of the stent 1, capturing the state of the stent surface as a line-shaped image by rotating the stent 1 at a prescribed angle and deciding the normal/ defective condition of the pattern width by comparing the captured image with the previously inputted reference data of the surface pattern.</p> |
申请公布号 |
JP2001070455(A) |
申请公布日期 |
2001.03.21 |
申请号 |
JP19990247372 |
申请日期 |
1999.09.01 |
申请人 |
NIPPON SHARYO SEIZO KAISHA LTD |
发明人 |
SHIMAMOTO EITETSU;NAKAO TORU;FUJISAWA YOSHIO;FURUTA YASUYUKI |
分类号 |
A61F2/91;A61M29/00;G01B11/02;G01B11/24;G01N21/956;(IPC1-7):A61M29/00 |
主分类号 |
A61F2/91 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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