发明名称 |
Method for patterning semiconductors with high precision, good homogeneity and reproducibility |
摘要 |
A thin-film system is deposited onto a surface of a semiconductor region. After at least one window has been opened in the thin-film system, the window serves as a mask for a first selective processing of a first semiconductor partial region. By undercutting the thin-film system, the edge of the window is drawn back approximately uniformly by a mean undercutting depth. The at least one enlarged window serves as a mask for a second selective processing of a second semiconductor partial region. A semiconductor structure is also provided.
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申请公布号 |
US6204135(B1) |
申请公布日期 |
2001.03.20 |
申请号 |
US20000494782 |
申请日期 |
2000.01.31 |
申请人 |
SICED ELECTRONICS DEVELOPMENT GMBH & CO KG |
发明人 |
PETERS DETHARD;SCHOERNER REINHOLD |
分类号 |
H01L21/306;H01L21/033;H01L21/04;H01L21/266;H01L21/336;H01L29/12;H01L29/24;H01L29/78;(IPC1-7):H01L21/336;H01L21/331;H01L21/302 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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