发明名称 Method for patterning semiconductors with high precision, good homogeneity and reproducibility
摘要 A thin-film system is deposited onto a surface of a semiconductor region. After at least one window has been opened in the thin-film system, the window serves as a mask for a first selective processing of a first semiconductor partial region. By undercutting the thin-film system, the edge of the window is drawn back approximately uniformly by a mean undercutting depth. The at least one enlarged window serves as a mask for a second selective processing of a second semiconductor partial region. A semiconductor structure is also provided.
申请公布号 US6204135(B1) 申请公布日期 2001.03.20
申请号 US20000494782 申请日期 2000.01.31
申请人 SICED ELECTRONICS DEVELOPMENT GMBH & CO KG 发明人 PETERS DETHARD;SCHOERNER REINHOLD
分类号 H01L21/306;H01L21/033;H01L21/04;H01L21/266;H01L21/336;H01L29/12;H01L29/24;H01L29/78;(IPC1-7):H01L21/336;H01L21/331;H01L21/302 主分类号 H01L21/306
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