发明名称 Method for forming multi-layered liner on sidewall of node contact opening
摘要 A method for forming a multi-layered liner on the sidewalls of a node contact opening includes the steps of providing a substrate having a dielectric layer thereon. The dielectric layer further includes a node contact opening that exposes a portion of the substrate. A first liner layer is then formed on the sidewalls of the node contact opening. Next, a second liner layer is formed over the first liner layer such that the first liner layer and the second liner layer together form a dual-layered liner. The first liner layer in contact with the dielectric layer has good insulation capacity while the second liner layer has good etch-resisting property.
申请公布号 US6204107(B1) 申请公布日期 2001.03.20
申请号 US19980208611 申请日期 1998.12.08
申请人 UNITED MICROELECTRONICS CORP. 发明人 LIN KUO-CHI;LIN KUEN-YOW;TSAI CHIEN-HUA;LIN KUN-CHI
分类号 H01L21/768;(IPC1-7):H01L21/823 主分类号 H01L21/768
代理机构 代理人
主权项
地址