发明名称 Fabrication method of capacitor for integrated circuit
摘要 A method for fabricating a capacitor for an integrated circuit, comprising the steps of forming a titanium film for an adhesion layer over a substrate, forming a titanium dioxide film for a diffusion barrier layer by annealing the titanium film after ion-implantation of oxygen ion into a surface region of the titanium film so as to change titanium in the surface region to titanium dioxide, and forming a high dielectric constant capacitor on the titanium dioxide film.
申请公布号 US6204111(B1) 申请公布日期 2001.03.20
申请号 US19990238157 申请日期 1999.01.28
申请人 MATSUSHITA ELECTRONICS CORPORATION 发明人 UEMOTO YASUHIRO;FUJII EIJI;ARITA KOJI;NAGANO YOSHIHISA;SHIMADA YASUHIRO;AZUMA MASAMICHI;INOUE ATSUO;IZUTSU YASUFUMI
分类号 H01L21/02;H01L21/314;H01L27/115;(IPC1-7):H01L21/824 主分类号 H01L21/02
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