发明名称 HIGH SPEED SAMPLING CIRCUIT AND METHOD FOR CALIBRATING PHASE IN THE CIRCUIT
摘要 PROBLEM TO BE SOLVED: To accurately maintain a sampling period set to each of a plurality of A/D converters, to calibrate the sampling period at high accuracy and to sample data at high speed with high accuracy. SOLUTION: An output clock of a system being a phase difference generating section 1a is used as a reference clock, and employs a phase difference detector 7 to detect the phase differences between the output clocks of other systems. A control means 15 uses DDS(direct digital synthesizer) 5b-5n to shift a phase of an output clock of other reception system so as to make a phase difference of the DDS 5b-5n of the other system from the reference clock accurate based on the detected phase difference. A sampling section 1b used A/D converters 17a-17n by each system to sample input data at different times to realize high speed sampling.
申请公布号 JP2001068981(A) 申请公布日期 2001.03.16
申请号 JP19990243595 申请日期 1999.08.30
申请人 ANRITSU CORP 发明人 OTSUKA TOSHIMASA;KONDO HISAKAZU;NODA HANAKO;MAEKAWA NAOSHI
分类号 H03M1/14;H03B28/00;H03K5/15;H03L7/00 主分类号 H03M1/14
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