发明名称 METHOD FOR TESTING OPTICAL ELEMENT ARRAY
摘要 PROBLEM TO BE SOLVED: To provide a method for testing optical element array by which the light output characteristic of each element of an optical element array can be measured with accuracy without ignoring thermal effect even when the array has a high degree of integration. SOLUTION: In measuring the light output characteristic of the element 10b-4 of a surface emission type laser element array 10b in which surface emission type laser elements 10b-1 to 10b-20 are arranged in two transversal rows each of which is composed of ten elements, the light output characteristic of the element 10b-4 is measured by only energizing the element 10b-3, 10b-5, and 10b-13 to 10b-15 surrounding the element 10b-4.
申请公布号 JP2001066222(A) 申请公布日期 2001.03.16
申请号 JP19990244344 申请日期 1999.08.31
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 TAKESHITA TATSUYA;KAGAWA TOSHIAKI;TOMORI YUICHI
分类号 G01M11/00;(IPC1-7):G01M11/00 主分类号 G01M11/00
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