发明名称 SELF-DIAGNOSTIC SYSTEM AND METHOD FOR MAIN STORAGE DEVICE
摘要 PROBLEM TO BE SOLVED: To make a bank control part function test and memory test performable by a single main storage device including a cross bar function constituting a multi-processor system without connecting any processor with this storage device. SOLUTION: A pseudo request generating function part 21 is provided between a processor 1 and a cross bar 22 in a main storage device 2. The pseudo request generating function part 21 generates a command, an in-memory bank address and an RA, and issues a pseudo request for operating bank control part function test or memory test to the cross bar 22. Also, the pseudo request generating function part 21 is provided with a counter for counting the number of request/reply and an address counter for counting-up this each time the request is issued at the time of memory test. Moreover, this pseudo request generating function 21 is provided with a function for comparing data read with a reading command with held writteen data and a function for checking-on an ECC circuit at the time of memory test.
申请公布号 JP2001067274(A) 申请公布日期 2001.03.16
申请号 JP19990242074 申请日期 1999.08.27
申请人 NEC KOFU LTD 发明人 ARIIZUMI TAKEHITO
分类号 G06F12/16;G06F11/22;(IPC1-7):G06F12/16 主分类号 G06F12/16
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