| 摘要 |
PROBLEM TO BE SOLVED: To obtain a semiconductor integrated circuit with built-in capacitors which does not become defective even when a failure occurs in one of the capacitors built in the circuit and in which no current fault occurs in the peripheral circuit of a capacitor circuit even when a fault occurs in the capacitor. SOLUTION: A semiconductor integrated circuit with built-in capacitors is provided with a plurality of capacitor 12, a failure deciding circuit 13 which detects the failures of the capacitors 12, and an activating circuit 14 which activates or inactivates the capacitors 12 based on the detected results of the circuit 13. A semiconductor device with built-in capacitor is provided with a plurality of capacitors and secures the capacitance required for operation by composing the capacitances of the capacitors. The failure deciding circuit 13 detects a defective capacitor. The activating circuit 14 inactivates the defective capacitor detected by means of the circuit 13.
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