发明名称 SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor wafer having a discriminating character or symbol by laser marking without deteriorating any of intensity, cleanness and flatness of the wafer. SOLUTION: Each character or symbol marked on a semiconductor wafer is formed as a dot marked by lasering, the dot has a diameter 'a' of 15 to 50μm, has a depth of 'b' of 0.1 to 1.0μm, and has height of an outer ring 'c' of 0.1 to 0.5μm.
申请公布号 JP2001068390(A) 申请公布日期 2001.03.16
申请号 JP19990238222 申请日期 1999.08.25
申请人 HITACHI CABLE LTD 发明人 ONISHI MASAYA
分类号 H01L23/00;H01L21/02;H01S3/00;(IPC1-7):H01L21/02 主分类号 H01L23/00
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