发明名称 GATE SPACER STRUCTURE AND FORMING METHOD THEREOF
摘要 PURPOSE: A gate spacer structure and a method for forming the same are provided to prevent bridge between a gate pattern and a bit line by entirely covering a gate electrode using silicon nitride as a spacer. CONSTITUTION: A gate pattern(200) sequentially stacked on a gate oxide pattern(110), a gate electrode(120) and a capping insulator pattern(130) is formed on a semiconductor substrate(100). An oxide spacer(141) is formed at both sidewalls of the gate electrode(120) and the gate oxide pattern(110). Also, a gate spacer(161) is formed at both sidewalls of the oxide spacer(141) and the capping insulator pattern(130). Thereby, the capping insulator pattern(130) is directly connected to the gate spacer(161). Therefore, the gate electrode(120) and the gate oxide pattern(110) are entirely covered by the capping insulator pattern(130) and the gate spacer(161). The capping insulator pattern(130) and the gate spacer(161) are made of silicon nitride.
申请公布号 KR20020085072(A) 申请公布日期 2002.11.16
申请号 KR20010024339 申请日期 2001.05.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JAE HAK;LEE, GYEONG U;LEE, SU GEUN;SHIN, HONG JAE
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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