| 摘要 |
PROBLEM TO BE SOLVED: To certainly and accurately detect defects on a surface without being affected by illuminance irregularity or the like on the curved surface of a work. SOLUTION: This device comprises a ring illumination 30 for radiating illumination light to the curved surface of an O-ring W; a CCD camera 40 for picking up an image on the surface of the O-ring W; and a computer 50 that processes image data provided by the CCD camera 40 and outputs defect information on the surface of the O-ring W. A defect detecting means 51 provided for the computer 50 determines an average illuminance distribution formed by smoothing an illuminance distribution on the surface of the O-ring W, monitors an illuminance difference provided from a difference between this average illuminance distribution and an actual illuminance distribution, and detects a defect based on the illuminance difference exceeding a predetermined level.
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