| 摘要 |
PROBLEM TO BE SOLVED: To provide a fine particle component analyzing apparatus capable of detecting the intensity of light accurately without using a slit. SOLUTION: In a fine particle component analyzing apparatus, fine particles are atomized, ionized and excited to emit light, and this light is guided to a spectroscope of which the measuring wavelength is set so as to be capable of measuring the predetermined wavelength in the emitted light, and converted to an electric signal by the photoelectric converter arranged to the rear stage of the spectroscope to measure the size of the specific element contained in the fine particles. An array type photomultiplier element 35 is used as the photoelectric converter.
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