发明名称 |
METHOD FOR FORMING CARRIER FILM FOR CHEMICAL MECHANICAL POLISHING APPARATUS |
摘要 |
PURPOSE: A method for forming a carrier film used for a chemical mechanical polishing apparatus is provided to obtain a uniform contact surface of the carrier film. CONSTITUTION: For a chemical mechanical polishing(CMP) apparatus, a carrier film(116) is attached under a rotatable carrier base(112). The carrier film(116) is then polished by a polishing pad with slurry used, so that a wafer contact surface of the carrier film(116) is made smoothly and uniformly. Preferably, a mixed solution of deionized water and potassium hydroxide is used as the slurry. A wafer(140) is supported under the carrier base(112) by a supporting ring(114) formed at lower edges of the carrier base(112), while the carrier film(116) is interposed between the carrier base(112) and the wafer(140) to absorb a mechanical shock generated therebetween.
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申请公布号 |
KR20010019144(A) |
申请公布日期 |
2001.03.15 |
申请号 |
KR19990035421 |
申请日期 |
1999.08.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, YEONG RAE;YOON, BO EON |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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主权项 |
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地址 |
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