发明名称 METHOD FOR FORMING CARRIER FILM FOR CHEMICAL MECHANICAL POLISHING APPARATUS
摘要 PURPOSE: A method for forming a carrier film used for a chemical mechanical polishing apparatus is provided to obtain a uniform contact surface of the carrier film. CONSTITUTION: For a chemical mechanical polishing(CMP) apparatus, a carrier film(116) is attached under a rotatable carrier base(112). The carrier film(116) is then polished by a polishing pad with slurry used, so that a wafer contact surface of the carrier film(116) is made smoothly and uniformly. Preferably, a mixed solution of deionized water and potassium hydroxide is used as the slurry. A wafer(140) is supported under the carrier base(112) by a supporting ring(114) formed at lower edges of the carrier base(112), while the carrier film(116) is interposed between the carrier base(112) and the wafer(140) to absorb a mechanical shock generated therebetween.
申请公布号 KR20010019144(A) 申请公布日期 2001.03.15
申请号 KR19990035421 申请日期 1999.08.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, YEONG RAE;YOON, BO EON
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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