发明名称 |
ELECTROSTATIC CHUCK OF APPARATUS FOR ETCHING SEMICONDUCTOR |
摘要 |
PURPOSE: An electrostatic chuck of an apparatus for etching a semiconductor is provided to prevent a manufacturing process from being delayed by an error of an equipment, by preventing cooling gas from over-leaking by a foreign substance when the foreign substance is generated on a lower surface of a wafer. CONSTITUTION: A plurality of elevating pins(12) are installed to be elevated in a body(11). A plurality of gas supplying holes(13) are installed in the periphery of the elevating pins. Ring-type supporting projections(14) having different sizes and a constant height are projected on an upper surface of the body so that a wafer is separated on the upper surface of the body.
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申请公布号 |
KR20010018837(A) |
申请公布日期 |
2001.03.15 |
申请号 |
KR19990034951 |
申请日期 |
1999.08.23 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KIM, SANG GYEONG |
分类号 |
H01L21/68;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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