发明名称 MICROELECTRONIC DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PURPOSE: A micro-electronic device having high dielectric coefficient and containing an adhesive layer and an insulation material useable as a gate electrode liner for the device and the manufacturing method thereof are provided. CONSTITUTION: The manufacturing method of this device includes a first step of forming a first electrode, a second step of depositing an adhesive layer made of a single material or a combination of materials selected from among Ta, TaNx, W, WNx, Ta/TaNx, and W/WNx, on the first electrode by using physical vapor growth of high-density plasma, a third step of depositing a dielectric layer on the adhesive layer, and a fourth step of forming a second electrode on the dielectric layer. This micro-electronic device has a first electrode, a second electrode(34), a dielectric layer(36) provided between the first and second electrodes, and a adhesive layer(40) provided between the first electrode and dielectric layer. The adhesive layer is made of a single material or a combination of materials selected from among Ta, TaNx, W, WNx, Ta/TaNx, and W/WNx.
申请公布号 KR20010021130(A) 申请公布日期 2001.03.15
申请号 KR20000042989 申请日期 2000.07.26
申请人 APPLIED MATERIALS INC. 发明人 CHIANG TONY P;BINGII SAN;SURAJI RENGARAJAN;PIIJUN DEIN;CHIN BARRY L
分类号 C23C14/06;C23C14/08;C23C14/34;H01G4/10;H01G4/33;H01G4/40;H01L21/02;H01L21/203;H01L21/285;H01L21/316;H01L21/336;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/336 主分类号 C23C14/06
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