发明名称 |
METHOD FOR MANUFACTURING TANTALUM OXIDE LAYER CAPACITOR |
摘要 |
PURPOSE: A method for manufacturing a tantalum oxide layer capacitor is to provide high capacitance by preventing a storage electrode from being oxidized so that a low dielectric layer is not formed to enlarge a grain size of a tantalum oxide layer. CONSTITUTION: After an interlayer dielectric(20) is stacked on a semiconductor substrate(10) and a contact hole(25) is formed by a masking etch process, a storage electrode having a groove part is formed with a doped amorphous polysilicon layer. A nitride layer(40) is stacked on the storage electrode by a preprocessing process. After a tantalum oxide layer(50) functioning as a dielectric material is deposited on the nitride layer, a postprocessing process is performed at low temperature to decrease a dislocation density. A metal layer is stacked and patterned to form a plate electrode(60). An annealing process is performed regarding the resultant structure to crystallize the tantalum oxide layer.
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申请公布号 |
KR20010020024(A) |
申请公布日期 |
2001.03.15 |
申请号 |
KR19990036708 |
申请日期 |
1999.08.31 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, TAE HYEOK;OH, HUN JEONG |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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