发明名称 METHOD FOR MANUFACTURING TANTALUM OXIDE LAYER CAPACITOR
摘要 PURPOSE: A method for manufacturing a tantalum oxide layer capacitor is to provide high capacitance by preventing a storage electrode from being oxidized so that a low dielectric layer is not formed to enlarge a grain size of a tantalum oxide layer. CONSTITUTION: After an interlayer dielectric(20) is stacked on a semiconductor substrate(10) and a contact hole(25) is formed by a masking etch process, a storage electrode having a groove part is formed with a doped amorphous polysilicon layer. A nitride layer(40) is stacked on the storage electrode by a preprocessing process. After a tantalum oxide layer(50) functioning as a dielectric material is deposited on the nitride layer, a postprocessing process is performed at low temperature to decrease a dislocation density. A metal layer is stacked and patterned to form a plate electrode(60). An annealing process is performed regarding the resultant structure to crystallize the tantalum oxide layer.
申请公布号 KR20010020024(A) 申请公布日期 2001.03.15
申请号 KR19990036708 申请日期 1999.08.31
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, TAE HYEOK;OH, HUN JEONG
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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