| 摘要 |
PURPOSE: A semiconductor memory is provided to be replaced by a redundant memory cell without using an expensive external computer. CONSTITUTION: The semiconductor memory is provided with a BIST(built-in self test) computing unit(14) and a special algorithm for a defective memory cell, word line, and a bit line, and a redundant memory cell, a bit line, and a word line are determined. In this case, a counter unit(15) is provided in the BIST computing unit(14), the counter unit counts up to the upper limit using the number of defective memory cells as a hit value, and when a hit value exceeds the upper limit, a corresponding word line or a bit line is replaced.
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