| 摘要 |
<p>A Built-In Self Test (BIST) system 100 is provided for testing data transmission health at the payload level of a satellite communication system 400 and within a communications satellite 130 of the system 400. The BIST system 100 includes a demodulator 136 having a BIST pattern generator injecting a BIST pattern into the data stream of a communications satellite 130. A BIST comparator downstream in the data stream compares the BIST pattern it receives with a predetermined, known BIST pattern. The BIST comparator may be located within an on-board computer 142, a processing module 165 within a routing processor 140, or a demodulator 122 within a receive ground terminal 120, for example. Additionally, the BIST pattern may be passed from an input crossbar switch 138, an output crossbar switch 180, a data switch 160 within a routing processor 140, or a processing module 165 within a routing processor 140 to the on-board computer 142 for the BIST comparison. Additionally, the BIST pattern may be crosslinked between satellites in the satellite communication system 400 or may be looped back from the output crossbar switch 144 to the input crossbar switch 138 of the satellite 130. The BIST pattern may be supplied to the BIST generator by a data generator circuit such as a ROM, a memory within the on-board computer 142, or a ground command circuit. <IMAGE></p> |
