发明名称 |
Insulated gate type semiconductor device and process for producing the device |
摘要 |
A side insulation layer is formed on a side wall of a gate electrode by oxidizing (or nitrizing) a substance of the gate electrode, so that the gate electrode is insulated from the semiconductor substrate with the side insulation layer and a gate insulation film. The gap between the gate electrode and the semiconductor substrate is greater around the side wall of the gate electrode than around the center thereof. The gap between the side wall of the gate electrode and the semiconductor substrate is densely filled with an insulating substance.
|
申请公布号 |
US6200868(B1) |
申请公布日期 |
2001.03.13 |
申请号 |
US19980126722 |
申请日期 |
1998.07.31 |
申请人 |
TOYOTA JIDOSHA KABUSHIKI KAISHA |
发明人 |
MASE AKIRA;KUSHIDA TOMOYOSHI |
分类号 |
H01L29/78;H01L21/336;H01L29/10;H01L29/423;H01L29/739;(IPC1-7):H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|