发明名称 Method and apparatus for determining short circuit conditions using a gang probe circuit tester
摘要 A method for determining whether short circuits exist among networks within a circuit under test includes bringing test probes into contact with each such network and switching groups of the test probes among two sides of a test circuit so that current flows through the testing circuit only when one of the test probes connected to one side of the testing circuit is connected by means of a short circuit to one of the test probes connected to the other side of the test circuit. This first test process establishes the fact that a short circuit exists without determining which networks are connected by the short circuit. A version of this method subsequently applies tests to individual networks to make this determination, in the event that a short circuit is found to exist by the first test process. Other versions of this method additionally determine which networks are connected to which other networks by short circuits.
申请公布号 US6201383(B1) 申请公布日期 2001.03.13
申请号 US19980010910 申请日期 1998.01.22
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 LO JIANN-CHANG;MAHLBACHER JAMES CHRISTOPHER
分类号 G01R1/073;G01R31/02;(IPC1-7):G01R19/00 主分类号 G01R1/073
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