发明名称 |
Method and apparatus for determining short circuit conditions using a gang probe circuit tester |
摘要 |
A method for determining whether short circuits exist among networks within a circuit under test includes bringing test probes into contact with each such network and switching groups of the test probes among two sides of a test circuit so that current flows through the testing circuit only when one of the test probes connected to one side of the testing circuit is connected by means of a short circuit to one of the test probes connected to the other side of the test circuit. This first test process establishes the fact that a short circuit exists without determining which networks are connected by the short circuit. A version of this method subsequently applies tests to individual networks to make this determination, in the event that a short circuit is found to exist by the first test process. Other versions of this method additionally determine which networks are connected to which other networks by short circuits.
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申请公布号 |
US6201383(B1) |
申请公布日期 |
2001.03.13 |
申请号 |
US19980010910 |
申请日期 |
1998.01.22 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
LO JIANN-CHANG;MAHLBACHER JAMES CHRISTOPHER |
分类号 |
G01R1/073;G01R31/02;(IPC1-7):G01R19/00 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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地址 |
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