| 摘要 |
A semiconductor IC (Integrated Circuit) device with a dynamic BT (Bias Test) capability includes a semiconductor IC including a clock generator. A clock output from the clock generator is once fed to the outside of the IC and again input to a clock input terminal included in the IC. In response to the clock, a data generator generates a data signal for a dynamic BT. The data signal is sequentially propagated through a group of registers also included in the IC. At the time of a dynamic BT, the device does not need a clock from an external pattern generator or various control signals and thereby reduces the dynamic BT cost.
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