发明名称 COMPOSITION AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To form a low-permittivity uniform film excellent in adhesiveness on a semiconductor substrate by using a composition containing a polyquinoline resin and a silane compound. SOLUTION: A composition comprising a silane compound represented by formula I, II of III (wherein R1 to R8 are each H, methyl, ethyl, propyl, butyl, hexyl, cycolohxyl, phenyl or benzyl; (k) is 1 or 2; (m), (a), (p), (r), (s) and (t) are each an integer of 0 to 10; and (n), (q) and (u) are each 1, 2 or 3) and a polyquinoline resin is used. Preferably, 100 pts.wt. polyquinoline resin is compounded with 0.01 to 15 pts.wt. silane compound and 600 to 2,000 pts.wt. organic solvent (e.g. phenol). Except specified areas of a circuit element, the surface of a semiconductor substrate is covered with a protective film 2; on the uncovered areas of the circuit element, a first conductor layer 3 is formed; and the semiconductor substrate 1 is coated with the composition e.g. by the spinner method and is thermally treated to form an interlayer insulation film layer 4. The process is repeated, and finally a surface protection film layer 8 is formed.
申请公布号 JP2001064579(A) 申请公布日期 2001.03.13
申请号 JP19990243397 申请日期 1999.08.30
申请人 HITACHI CHEM CO LTD 发明人 UEJIMA KOICHI;TAKAYASU REIKO;ABE KOICHI;NOMURA YUTAKA
分类号 H01L21/768;C08L79/04;C09D179/04;H01L21/312;H01L23/522;(IPC1-7):C09D179/04 主分类号 H01L21/768
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