发明名称 EXTRACTION OF IMPERFECTION FEATURES THROUGH SPECTRAL ANALYSIS
摘要 Autonomous non-destructive inspection equipment provides automatic and/or continuous inspection and evaluation of a material under inspection. The inspection equipment preferably comprises at least one detection sensor and at least one detection sensor interface for a computer. The autonomous non-destructive inspection capability may also be retrofitted into conventional inspection systems by extracting pertinent features through spectral frequency analysis and sensor compensation and utilizing those features in the autonomous non-destructive inspection system.
申请公布号 US2007219757(A1) 申请公布日期 2007.09.20
申请号 US20070743550 申请日期 2007.05.02
申请人 发明人 PAPADIMITRIOU WANDA G.;PAPADIMITRIOU STYLIANOS
分类号 G06F19/00;G06F17/40 主分类号 G06F19/00
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