TRAY FOR TESTING SEMICONDUCTOR DEVICE

摘要

PURPOSE: A tray for testing a semiconductor device is provided to enhance reliability of a semiconductor test by stabilizing a loading state of a semiconductor device and forming uniformly an aligning state of the semiconductor device. CONSTITUTION: A main body(10) of a tray is formed with a base plate(20) and a cover(30). The cover(30) is combined with one side of the base plate(20) by a hinge. A multitude of partition walls(21) are formed on the base plate(20). A plurality of pocket members(22) are elastically formed in the partition walls(21). A multitude of partition walls(31) are formed on the cover(30). A plurality of pocket covers(32) are formed on the partition walls(31). The pocket covers(32) formed in the cover(30) corresponds to the pocket members(22) formed in the partition walls(21).