发明名称 APPARATUS FOR FABRICATING SEMICONDUCTOR DEVICE AND METHOD FOR FORMING PATTERN OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: An apparatus for fabricating a semiconductor device and a method for forming a pattern of a semiconductor device are provided to form a uniform and desired contact hole pattern by performing a flow process on a photoresist pattern. CONSTITUTION: A wafer loading portion(42) is used for loading a wafer cassette including a multitude of wafer. An HMDS coating portion(34) is used for increasing an adhesive strength of a photoresist on a surface of the wafer. A developing portion(44) is used for performing a developing process for the exposed wafer and forming a photoresist pattern on the wafer. A soft bake portion(37) is used for removing a solvent from the wafer. A PEB(Post Exposure Bake) portion(42) is used for removing a standing wave from the wafer. A hard bake portion(40) is used for hardening the photoresist pattern. A UV(Ultra-Violet) bake portion(48) is used for irradiating a UV ray to the developed wafer.
申请公布号 KR100291331(B1) 申请公布日期 2001.03.10
申请号 KR19980031545 申请日期 1998.08.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, GWANG SEOK;JUNG, GYU CHAN;JUNG, JIN HANG;KIM, YEONG SEON;LEE, HONG
分类号 H01L21/027;H01L21/30;(IPC1-7):H01L21/027 主分类号 H01L21/027
代理机构 代理人
主权项
地址