发明名称 |
ПОДЛОЖКА КАРБИДА КРЕМНИЯ И СПОСОБ ПОЛУЧЕНИЯ ПОДЛОЖКИ И ПОЛУПРОВОДНИКОВОЕ УСТРОЙСТВО, ИСПОЛЬЗУЮЩЕЕ ПОДЛОЖКИ |
摘要 |
A silicon carbide thin film is epitaxially grown by an MBE or the like method with silicon atoms 2 being maintained to be in excess of carbon atoms on a growth surface 1a of a silicon carbide crystal in a substrate 1. A silicon carbide substrate with a good crystallinity is thereby achieved at a low temperature with a good reproducibility. This crystal growth is possible at a low temperature of 1300 DEG C or lower, and the productions of a high-concentration doped film, a selectively grown film, and a grown film of a cubic silicon carbide on a hexagonal crystal are achieved. In crystallizing a cubic silicon carbide on a hexagonal crystal, the use of an off-cut surface inclined towards a &lang&1100&rang& direction is effective to prevent an occurrence of twin. <IMAGE> |
申请公布号 |
RU99111953(A) |
申请公布日期 |
2001.03.10 |
申请号 |
RU19990111953 |
申请日期 |
1998.08.27 |
申请人 |
МАТСУСИТА ЭЛЕКТРИК ИНДАСТРИАЛ КО.;ЛТД. (JP) |
发明人 |
КИТАБАТАКЕ Макото (JP);УТИДА Масао (JP);ТАКАХАСИ Кунимаса (JP) |
分类号 |
H01L21/205;C30B23/02;H01L21/04;H01L21/20;H01L21/203;H01L29/04;H01L29/10;H01L29/24;H01L29/80 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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