| 摘要 |
<p>The invention concerns a method based on a model with two independent mesh generations of an integrated circuit (Φ): the surfaces (η) of the conductors (1) are divided into surface elements whereon electrical charges are determined, and the entire volume of the circuit is divided into uniform volume elements deemed to be homogeneous dielectrics whereon the potential is determined. Thus, stray capacitances can be easily measured in the interconnections, without having to store a large amount of data concerning shapes or parameters of the elements, which are uniform in this case, thereby substantially accelerating processing by reducing storage occupancy.</p> |
