发明名称 Process for the manufacturing of integrated circuits, particularly of intelligent power semiconductor devices
摘要 <p>A process for the manufacturing of integrated ciruits comprises the steps of: forming an oxide layer (5,6) on at least one surface of two respective semiconductor material wafers (1,2); obtaining a single semiconductor material wafer with a first layer (3,9) and a second layer (2) of semiconductor material and a buried oxide layer (8) interposed therebetween starting from said two semiconductor material wafers (1,2) by direct bonding of the oxide layers (5,6) previously grown; submitting the single wafer to a controlled reduction of the thickness of the first layer (3,9) of semiconductor material; lapping a top surface of the first layer (3,9) of semiconductor material; selectively introducing dopant impurities into selected regions (12,13,14) of the first layer (3,9) of semiconductor material to form the desired integrated components; forming trenches (18) laterally delimiting respective portions of the first layer (3,9) of semiconductor material wherein integrated components are present which are to be electrically isolated from other integrated components; filling the trenches (18) with an insulating material (20). <IMAGE></p>
申请公布号 EP0661735(B1) 申请公布日期 2001.03.07
申请号 EP19930830529 申请日期 1993.12.29
申请人 CONSORZIO PER LA RICERCA SULLA 发明人 RONSISVALLE, CESARE
分类号 H01L21/762;H01L21/822;H01L21/84;H01L27/06;H01L27/12;(IPC1-7):H01L21/76;H01L21/82 主分类号 H01L21/762
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